We’re thrilled to announce the publication of our new paper in Nanoscale, titled “High-throughput nanoscale metrology of ultrathin inert and functionalized dielectric substrates using plasmonic nanoparticles”.
This work offers a breakthrough in quickly and reliably measuring ultrathin dielectric films across large areas — a key challenge for sensors, coatings and advanced surface technologies.
Using plasmonic gold nanoparticles and our AVAC optical platform, we can evaluate films with nanometre-level precision and sub-micrometre spatial resolution — and do so over hundreds of cm² in minutes. We demonstrated this both on inert oxide layers and biologically/chemically functionalised substrates (including a biosensor example for cytokine IL-6).
This method delivers speed, scale, and accuracy in one package — making it ideal for industrial-scale metrology of ultrathin films.
Read the full article for methodology, data and implications (DOI: 10.1039/D5NR02972D).
